Patents/Inventors

Hilko Dirk Bos

UtrechtNL1 patent

2 Patents

US122769212025
Substrate Comprising a Target Arrangement, and Associated at Least One Patterning Device, Lithographic Method and Metrology Method
ASML Netherlands B.V.
0 cites
US121054322024
Metrology Method and Associated Computer Product
ASML Netherlands B.V.
0 cites