Patents/Inventors

Hideyuki Sunaga

WakoJP4 patents

5 Patents

US119857552024
Target Structure and Target Device
RIKEN
0 cites
US117545162023
Nondestructive Test System Comprising a Neutron Emission Unit for Emitting Fast Neutrons and a Neutron Detection Unit for Detecting Thermal Neutrons, and Nondestructive Test Method
RIKEN
0 cites
US117472882023
Non-destructive Inspection System Comprising Neutron Radiation Source and Neutron Radiation Method
RIKEN
0 cites
US116144152023
Nondestructive Testing System and Nondestructive Testing Method
RIKEN
0 cites
US116091902023
Non-destructive Inspection Method
RIKEN
0 cites