Patents/Inventors

Hideo Toraya

AkishimaJP4 patents

5 Patents

US124052352025
Degree-of-crystallinity Measurement Apparatus, Degree-of-crystallinity Measurement Method, and Information Storage Medium
RIGAKU CORPORATION
0 cites
US122873002025
Device and Method for Analyzing Diffraction Pattern of Mixture, and Information Storage Medium
RIGAKU CORPORATION
0 cites
US120319272024
Method and Device for Analyzing Diffraction Pattern of Mixture, and Information Storage Medium
RIGAKU CORPORATION
0 cites
US118525972023
Degree-of-crystallinity Measurement Apparatus, Degree-of-crystallinity Measurement Method, and Information Storage Medium
RIGAKU CORPORATION
0 cites
US118413342023
Quantitative Phase Analysis Device, Quantitative Phase Analysis Method, and Non-transitory Computer-readable Storage Medium Storing Quantitative Phase Analysis Program
RIGAKU CORPORATION
0 cites