Hideki Nakayama

6 Patents

• US125640162026

  Defect Observation Method, Apparatus, and Program

  Hitachi High-tech Corporation

  0 cites
• US123984142025

  Biological Sample Analysis Apparatus and Biological Sample Analysis Method

  HORIBA ADVANCED TECHNO, CO., Ltd.

  0 cites
• US122605452025

  Sample Observation Device and Method

  Hitachi High-tech Corporation

  0 cites
• US122366672025

  Learning Method and Processing Apparatus Regarding Machine Learning Model Classifying Input Image

  THE UNIVERSITY OF TOKYO

  0 cites
• US122103382025

  Computer System of Observation Device and Processing Method

  Hitachi High-tech Corporation

  0 cites
• US121238872024

  Sample Analyzing Device

  HORIBA ADVANCED TECHNO, CO., Ltd.

  0 cites