Patents/Inventors

Hideki Morii

TsuchiuraJP3 patents

5 Patents

US123739742025
Shape Measurement Device and Method for Controlling Same
TOKYO SEIMITSU CO., Ltd.
0 cites
US119404632024
Particle Measurement Device, Three-dimensional Shape Measurement Device, Prober Device, Particle Measurement System, and Particle Measurement Method
TOKYO SEIMITSU CO., Ltd.
0 cites
US118599692024
Measurement Device
TOKYO SEIMITSU CO., Ltd.
0 cites
US117400722023
Inner Surface Shape Measurement Device, and Alignment Method and Magnification Calibration Method for Inner Surface Shape Measurement Device
TOKYO SEIMITSU CO., Ltd.
0 cites
US117400742023
Inner Surface Shape Measurement Device, and Alignment Method for Inner Surface Shape Measurement Device
TOKYO SEIMITSU CO., Ltd.
0 cites