Patents/Inventors

Hermanus Adrianus Dillen

VeldhovenNL11 patents

10 Patents

US125663852026
Method for Determining a Field-of-view Setting
ASML NETHERLANDS B.V.
0 cites
US123862682025
Method for Calibrating Simulation Process Based on Defect-based Process Window
ASML NETHERLANDS B.V.
0 cites
US123151752025
Method in the Manufacturing Process of a Device, a Non-transitory Computer-readable Medium and a System Configured to Perform the Method
ASML NETHERLANDS B.V.
0 cites
US121241792024
Method of Wafer Alignment Using at Resolution Metrology on Product Features
ASML NETHERLANDS B.V.
0 cites
US119729222024
Method for Calibrating a Scanning Charged Particle Microscope
ASML Netherlands B.V.
0 cites
US118605482024
Method for Characterizing a Manufacturing Process of Semiconductor Devices
ASML NETHERLANDS B.V.
0 cites
US117969202023
Method for Controlling a Manufacturing Process and Associated Apparatuses
ASML NETHERLANDS B.V.
0 cites
US117336142023
Method of Metrology and Associated Apparatuses
ASML Netherlands B.V.
0 cites
US116686612023
Inspection Tool and Inspection Method
ASML Netherlands B.V.
0 cites
US116461742023
Method for Calibrating a Scanning Charged Particle Microscope
ASML Netherlands, B.V.
0 cites