Patents/Inventors

Heiko Ahrens

NeubibergDE3 patents

3 Patents

US120555872024
Integrated Test Circuit, Test Assembly and Method for Testing an Integrated Circuit
Infineon Technologies AG
0 cites
US118743252024
Integrated Circuit, Test Assembly and Method for Testing an Integrated Circuit
Infineon Technologies AG
0 cites
US116196682023
Integrated Circuit with Self-test Circuit, Method for Operating an Integrated Circuit with Self-test Circuit, Multi-core Processor Device and Method for Operating a Multi-core Processor Device
Infineon Technologies AG
0 cites