3 Patents
- US120578442024Digital Droop Detector, Semiconductor Device Including the Same, and Calibration Method Thereof
Samsung Electronics Co., Ltd.
0 cites - US118677572024Built-in Self-test Circuits and Semiconductor Integrated Circuits Including the Same
Samsung Electronics Co., Ltd.
0 cites - US116984102023Semiconductor Integrated Circuit and Method of Testing the Same
Samsung Electronics Co., Ltd.
0 cites