15 Patents
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- US122822492025Full-chip Cell Critical Dimension Correction Method and Method of Manufacturing Mask Using the Same
Samsung Electronics Co., Ltd.
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- US119839652024Electronic Device for Biometric Authentication and Method for Operating the Same
Samsung Electronics Co., Ltd.
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- US116382962023Link-based Autonomous Cell Scheduling Device and Method for Improved Traffic Throughput in TSCH Protocol
Pusan National University Industry-university Cooperation Foundation
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