7 Patents
- US123600632025System and Method for Measuring a Sample by X-ray Reflectance Scatterometry
NOVA MEASURING INSTRUMENTS Inc.
0 cites - US122818932025Characterizing and Measuring in Small Boxes Using XPS with Multiple Measurements
NOVA MEASURING INSTRUMENTS Inc.
0 cites - US120663912024Method and System for Non-destructive Metrology of Thin Layers
NOVA MEASURING INSTRUMENTS, Inc.
0 cites - US119885022024Characterizing and Measuring in Small Boxes Using XPS with Multiple Measurements
NOVA MEASURING INSTRUMENTS Inc.
0 cites - US118742372024System and Method for Measuring a Sample by X-ray Reflectance Scatterometry
NOVA MEASURING INSTRUMENTS Inc.
0 cites - US117330352023Feed-forward of Multi-layer and Multi-process Information Using XPS and XRF Technologies
NOVA MEASURING INSTRUMENTS Inc.
0 cites - US116686632023Method and System for Non-destructive Metrology of Thin Layers
NOVA MEASURING INSTRUMENTS, Inc.
0 cites