4 Patents
- US125300222026Process Chamber Qualification for Maintenance Process Endpoint Detection
Applied Materials, Inc.
0 cites - US122057912025Rating Substrate Support Assemblies Based on Impedance Circuit Electron Flow Using Machine Learning
Applied Materials, Inc.
0 cites - US120674852024Long Short-term Memory Anomaly Detection for Multi-sensor Equipment Monitoring
Applied Materials, Inc
0 cites - US118624932024Correcting Component Failures in Ion Implant Semiconductor Manufacturing Tool
Applied Materials, Inc.
0 cites