Patents/Inventors

Hao-yen Cheng

Taoyuan CityTW19 patents

12 Patents

US126017592026
Cantilever Probe Card Device and Light Scattering Probe
CHUNGHWA PRECISION TEST TECH. CO., Ltd.
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US125909902026
Cantilever Probe Card Device and Micro Electro Mechanical System (MEMS) Probe
CHUNGHWA PRECISION TEST TECH. CO., Ltd.
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US125909942026
Cantilever Probe Card Device and Solder Receiving Probe
CHUNGHWA PRECISION TEST TECH. CO., Ltd.
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US124679492025
Cantilever Probe Card Device and Light Absorption Probe
CHUNGHWA PRECISION TEST TECH. CO., Ltd.
0 cites
US122039612025
Vertical Probe Card Device and Fence-like Probe Thereof
CHUNGHWA PRECISION TEST TECH. CO., Ltd.
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US121814962024
Cantilever Probe Card and Probe Module Thereof
CHUNGHWA PRECISION TEST TECH. CO., Ltd.
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US121468972024
Vertical Probe Card Having Different Probes
CHUNGHWA PRECISION TEST TECH. CO., Ltd.
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US121113362024
Modular Vertical Probe Card
CHUNGHWA PRECISION TEST TECH. CO., Ltd.
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US120926612024
Cantilever Probe Card Device and Elastic Probe Thereof
CHUNGHWA PRECISION TEST TECH. CO., Ltd.
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US119886862024
Vertical Probe Card and Fence-like Probe Thereof
CHUNGHWA PRECISION TEST TECH. CO., Ltd.
0 cites
US119139732024
Cantilever Probe Card Device and Focusing Probe Thereof
CHUNGHWA PRECISION TEST TECH. CO., Ltd.
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US118799122024
Cantilever Probe Card and Carrier Thereof
CHUNGHWA PRECISION TEST TECH. CO., Ltd.
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