7 Patents
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- US123320432025Measurement Method for Interferometrically Determining a Surface Shape
CARL ZEISS SMT GmbH
0 cites - US122887062025Parameterizing X-ray Scattering Measurement Using Slice-and-image Tomographic Imaging of Semiconductor Structures
Carl Zeiss SMT GmbH
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- US122102892025Mirror, in Particular for a Microlithographic Projection Exposure Apparatus
CARL ZEISS SMT GmbH
0 cites - US118090852023Mirror, in Particular for a Microlithographic Projection Exposure Apparatus
CARL ZEISS SMT GmbH
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