4 Patents
- US125909882026Reference Sample Suitable to Calibrate Magnetic Microscope's Probe Tip and Calibration Method
CHINA JILIANG UNIVERSITY
0 cites - US121814412024Rapid Measuring Device and Measuring Method for Permanent Magnet Failure Temperature
CHINA JILIANG UNIVERSITY
0 cites - US119771332024Device and Method for Measuring Magnetism of Permanent Magnet Material at High Temperature
CHINA JILIANG UNIVERSITY
0 cites - US118623702024High-resistivity Sintered Samarium-cobalt Magnet and Preparation Method Thereof
China Jiliang University
0 cites