Patents/Inventors

Han-wei Wu

Tainan CityTW12 patents

11 Patents

US125884392026
Method of Manufacturing Semiconductor Structure with Spacer on Photoresist Layer
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites
US125819162026
Etch Monitoring and Performing
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites
US123745882025
Method for Evaluating Non-uniform Stress
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites
US123621802025
Method of Manufacturing Semiconductor Devices
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites
US121208862024
Memory Device and Manufacturing Method Thereof
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites
US119962972024
Method of Manufacturing a Semiconductor Device
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites
US119617382024
Method of Manufacturing Semiconductor Devices
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites
US118442242023
Memory Structure and Method of Forming the Same
Taiwan Semiconductor Manufacturing Company, Ltd.
0 cites
US118309362023
Gate Formation with Varying Work Function Layers
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites
US118044102023
Thin-film Non-uniform Stress Evaluation
Taiwan Semiconductor Manufacturing Co., Ltd.
0 cites
US117495702023
Etch Monitoring and Performing
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.
0 cites