Patents/Inventors

Hakgyun Kim

Suwon-siKR4 patents

4 Patents

US125793432026
Wafer Defect Prediction Device and Operating Method Thereof
Samsung Electronics Co., Ltd.
0 cites
US124743902025
Apparatus and Method Estimating Breakdown Voltage of Silicon Dioxide Film Using Neural Network Model
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US121118792024
Distribution Output Device and Operating Method
Samsung Electronics Co., Ltd.
0 cites
US116687432023
Semiconductor Device Defect Analysis Method
Samsung Electronics Co., Ltd.
0 cites