Patents/Inventors

Hajime Sasaki

TokyoJP2 patents

3 Patents

US120383962024
Crystal Defect Observation Method for Compound Semiconductor
Mitsubishi Electric Corporation
0 cites
US118857162024
Test Method of a Semiconductor Device and Manufacturing Method of a Semiconductor Device
Mitsubishi Electric Corporation
0 cites
US117472432023
Method of Producing Test-sample for Transmission Electron Microscope
Mitsubishi Electric Corporation
0 cites