Haijun Wei

2 Patents

• US120263182024

  Method and Apparatus for Determining Pressure Reference Value, and Chip and Electronic Device

  SHENZHEN GOODIX TECHNOLOGY CO., Ltd.

  0 cites
• US119101482024

  Method for Determining Capacitance Reference, Apparatus for Determining Capacitance Reference, and Device

  SHENZHEN GOODIX TECHNOLOGY CO., Ltd.

  0 cites