5 Patents
- 0 cites
- US123419402025System and Method for Measuring Depth of Stereoscopic Image
UNIVERSITY-INDUSTRY COOPERATION GROUP OF KYUNG HEE UNIVERSITY
0 cites - US122981852025Multi-view Luminance Measuring Device and Method for Measuring Multi-view Luminance
SAMSUNG DISPLAY CO., Ltd.
0 cites - US122609092025Method of Operating Selector Device, Method of Operating Nonvolatile Memory Apparatus Using the Same, Electronic Circuit Device Including Selector Device, and Nonvolatile Memory Apparatus
INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY ERICA CAMPUS
0 cites - US121260292024Catalyst and Method of Preparing Same
DAEGU GYEONGBUK INSTITUTE OF SCIENCE AND TECHNOLOGY
0 cites