Patents/Inventors

Gyuyeol Kim

Suwon-siKR3 patents

3 Patents

US125662132026
Test Device and Test Method Implementing the Same
SAMSUNG ELECTRONICS CO., Ltd.
0 cites
US120384582024
Probe for Testing a Semiconductor Device and a Probe Card Including the Same
KOREA INSTRUMENT CO., Ltd.
0 cites
US119211582024
Fan-out Buffer with Skew Control Function, Operating Method Thereof, and Probe Card Including the Same
Research & Business Foundation SUNGKYUNKWAN UNIVERSITY
0 cites