Patents/Inventors

Gyung Jin Kim

Icheon-siKR2 patents

4 Patents

US119338182024
Probe Test Card and Method of Manufacturing the Same
SK Hynix Inc.
0 cites
US118858462024
System and Method of Testing a Semiconductor Device
SK Hynix Inc.
0 cites
US115434332023
Probe Test Card and Method of Manufacturing the Same
SK Hynix Inc.
0 cites
US115434502023
System and Method of Testing a Semiconductor Device
SK Hynix Inc.
0 cites