Gwangnae Gil

5 Patents

• US125615032026

  Method of Predicting Characteristic of Semiconductor Device and Computing Device Performing the Same

  Samsung Electronics Co., Ltd.

  0 cites
• US125549712026

  Method of Predicting Characteristics of Semiconductor Device and Computing Device Performing the Same

  Samsung Electronics Co., Ltd.

  0 cites
• US124872722025

  Computing Devices for Predicting Electrical Tests, Electrical Test Prediction Apparatuses Having the Same, and Operating Methods Thereof

  Samsung Electronics Co., Ltd.

  0 cites
• US124120132025

  Method of Predicting Characteristic of Semiconductor Device and Computing Device Performing the Same

  Samsung Electronics Co., Ltd.

  0 cites
• US122223862025

  Method of Generating Device Model and Computing Device Performing the Same

  Samsung Electronics Co., Ltd.

  0 cites