Patents/Inventors

Guy Shwartz

Ramat GanIL3 patents

4 Patents

US124566002025
Scanning Electron Microscopy-based Tomography of Specimens
Applied Materials Israel Ltd.
0 cites
US122780852025
Hybrid Scanning Electron Microscopy and Acousto-optic Based Metrology
APPLIED MATERIALS ISRAEL Ltd.
0 cites
US118039612023
Die-to-multi-die Wafer Inspection
Applied Materials Israel Ltd.
0 cites
US116880552023
Methods and Systems for Analysis of Wafer Scan Data
Applied Materials Israel Ltd.
0 cites