Gurgen Harutyunyan

3 Patents

• US122664132025

  Built-in Self-test Circuit for Row Hammering in Memory

  Synopsys, Inc.

  0 cites
• US120945482024

  Diagnosing Faults in Memory Periphery Circuitry

  Synopsys, Inc.

  0 cites
• US120025302024

  Embedded Memory Transparent In-system Built-in Self-test

  Synopsys, Inc.

  0 cites