Guoliang Mao

5 Patents

• US124166692025

  Templatized Memory Pattern Generator and Method

  Macrotest Semiconductor Technology Co., Ltd

  0 cites
• US121307182024

  Soc-oriented Concurrent Test System for Multiple Clock Domains and Test Method Thereof

  Macrotest Semiconductor Inc.

  0 cites
• US121113492024

  Mixed Signal Test Device Based on Graphical Control

  Macrotest Semiconductor Inc.

  0 cites
• US120615292024

  Automatic Learning Method and System for Digital Test Vector

  Macrotest Semiconductor Inc.

  0 cites
• US120447202024

  Multi-core Test Processor, and Integrated Circuit Test System and Method

  Macrotest Semiconductor Inc.

  0 cites