7 Patents
- US126088332026Three-dimensional Measurement Method Based on End-to-end Deep Learning for Speckle Projection
NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
0 cites - US125663242026Inverted Microscopic Imaging System with Programmable LED Array for Multi-contrast Label-free Imaging
NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
0 cites - US122190422025Signal Sampling Method and Apparatus, and Optical Receiver
SANECHIPS TECHNOLOGY CO., Ltd.
0 cites - US119062862024Deep Learning-based Temporal Phase Unwrapping Method for Fringe Projection Profilometry
NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
0 cites - US118937192024Single-shot Differential Phase Contrast Quantitative Phase Imaging Method Based on Color Multiplexed Illumination
NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
0 cites - US116504062023Microscopic Imaging Method of Phase Contrast and Differential Interference Contrast Based on the Transport of Intensity Equation
NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
0 cites - US115559922023Programmable Annular Led Illumination-based High Efficiency Quantitative Phase Microscopy Imaging Method
NANJING UNIVERSITY OF SCIENCE AND TECHNOLOGY
0 cites