9 Patents
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- US122258082025In-line Monitoring of OLED Layer Thickness and Dopant Concentration
Applied Materials, Inc.
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- US118568332023In-line Monitoring of OLED Layer Thickness and Dopant Concentration
Applied Materials, Inc.
0 cites - US116091832023Methods and Systems to Measure Properties of Products on a Moving Blade in Electronic Device Manufacturing Machines
Applied Materials, Inc.
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