3 Patents
- US122353182025Methods for Determining and Calibrating Non-linearity in a Phase Interpolator and Related Devices and Systems
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US119065852024Methods and Systems for Performing Built-in-self-test Operations Without a Dedicated Clock Source
SAMSUNG ELECTRONICS CO., Ltd.
0 cites - US116011162023System and Method for Generating Sub Harmonic Locked Frequency Division and Phase Interpolation
SAMSUNG ELECTRONICS CO., Ltd.
0 cites