16 Patents
- US124111672025Tension-based Socket Gimbal for Engaging Device Under Test with Thermal Array
Advantest Test Solutions, Inc.
0 cites - US123744202025Carrier Based High Volume System Level Testing of Devices with Pop Structures
Advantest Test Solutions, Inc.
0 cites - US123457562025Integrated Test Cell Using Active Thermal Interposer (ATI) with Parallel Socket Actuation
Advantest Test Solutions, Inc.
0 cites - US123208522025Passive Carrier-based Device Delivery for Slot-based High-volume Semiconductor Test System
Advantest Test Solutions, Inc.
0 cites - 0 cites
- US122100562025Thermal Array with Gimbal Features and Enhanced Thermal Performance
Advantest Test Solutions, Inc.
0 cites - US122039582025Shielded Socket and Carrier for High-volume Test of Semiconductor Devices
Advantest Test Solutions, Inc.
0 cites - US121742482024Ergonomic Loading for a Test Interface Board (TIB) / Burn-in-board (BIB) in a Slot-based Test System
Advantest Test Solutions, Inc.
0 cites - 0 cites
- US118413922023Integrated Test Cell Using Active Thermal Interposer (ATI) with Parallel Socket Actuation
Advantest Test Solutiions, Inc.
0 cites - US118355492023Thermal Array with Gimbal Features and Enhanced Thermal Performance
Advantest Test Solutions, Inc.
0 cites - US118219132023Shielded Socket and Carrier for High-volume Test of Semiconductor Devices
Advantest Test Solutions, Inc.
0 cites - US118088122023Passive Carrier-based Device Delivery for Slot-based High-volume Semiconductor Test System
Advantest Test Solutions, Inc.
0 cites - US117420552023Carrier Based High Volume System Level Testing of Devices with Pop Structures
Advantest Test Solutions, Inc.
0 cites - US115876402023Carrier Based High Volume System Level Testing of Devices with Pop Structures
Advantest Test Solutions, Inc.
0 cites - 0 cites