Patents/Inventors

Gilad Laredo

HaifaIL7 patents

6 Patents

US125608712026
Metrology Target for Scanning Metrology
KLA Corporation
0 cites
US123796692025
Massive Overlay Metrology Sampling with Multiple Measurement Columns
KLA Corporation
0 cites
US119337172024
Sensitive Optical Metrology in Scanning and Static Modes
KLA Corporation
0 cites
US118993752024
Massive Overlay Metrology Sampling with Multiple Measurement Columns
KLA Corporation
0 cites
US118801412024
Method of Measuring Misregistration in the Manufacture of Topographic Semiconductor Device Wafers
KLA CORPORATION
0 cites
US115734972023
System and Method for Measuring Misregistration of Semiconductor Device Wafers Utilizing Induced Topography
KLA CORPORATION
0 cites