Patents/Inventors

Gilad Barak

RehovotIL21 patents

22 Patents

US124678792025
Optical Phase Measurement Method and System
NOVA Ltd.
0 cites
US123927332025
Combined Ocd and Photoreflectance Method and System
NOVA Ltd.
0 cites
US123724732025
Accurate Raman Spectroscopy
NOVA Ltd.
0 cites
US123665332025
Hybrid Metrology Method and System
0 cites
US123599682025
Systems and Methods for Optical Metrology
NOVA Ltd.
0 cites
US123604622025
Optical Metrology System and Method
NOVA Ltd.
0 cites
US122981822025
Optical Technique for Material Characterization
NOVA Ltd.
0 cites
US121966912025
X-ray Based Measurements in Patterned Structure
Nova Ltd.
0 cites
US121638922024
Accurate Raman Spectroscopy
NOVA Ltd.
0 cites
US121529932024
Accurate Raman Spectroscopy
NOVA Ltd.
0 cites
US120663852024
Raman Spectroscopy Based Measurements in Patterned Structures
NOVA Ltd
0 cites
US120255602024
Hybrid Metrology Method and System
0 cites
US119468752024
Optical Phase Measurement System and Method
NOVA Ltd.
0 cites
US119274812024
Optical Technique for Material Characterization
NOVA Ltd.
0 cites
US118857372024
Method and System for Optical Characterization of Patterned Samples
Nova Ltd.
0 cites
US118680542024
Optical Metrology System and Method
Nova Ltd.
0 cites
US118601042024
Accurate Raman Spectroscopy
NOVA Ltd
0 cites
US118028292023
Method and System for Broadband Photoreflectance Spectroscopy
NOVA Ltd.
0 cites
US117401832023
Accurate Raman Spectroscopy
Nova Ltd.
0 cites
US116929532023
X-ray Based Measurements in Patterned Structure
NOVA Ltd.
0 cites
US116399012023
Test Structure Design for Metrology Measurements in Patterned Samples
NOVA Ltd
0 cites
US115432942023
Optical Technique for Material Characterization
NOVA Ltd.
0 cites