Patents/Inventors

Gijsbert Rispens

EerselNL2 patents

3 Patents

US124746292025
Membrane for EUV Lithography
ASML NETHERLANDS B.V.
0 cites
US118222552023
Process Window Based on Defect Probability
ASML Netherlands B.V.
0 cites
US117622812023
Membrane for EUV Lithography
ASML NETHERLANDS B.V.
0 cites