Patents/Inventors

Germain Louis Fenger

Gladstone, ORUS3 patents

2 Patents

US125117732025
Wafer Image Denoising and Contour Extraction for Manufacturing Process Calibration
Siemens Industry Software Inc.
0 cites
US124820902025
Wafer Image Defect Detection and Characterization for Manufacturing Process Calibration
Siemens Industry Software Inc.
0 cites