Patents/Inventors

Gapkyoung Kim

Suwon-siKR1 patent

2 Patents

US124999612025
Built-in-self-test Logic, Memory Device with Same, and Memory Module Testing Method
Samsung Electronics Co., Ltd.
0 cites
US118042762023
Built-in-self-test Logic, Memory Device with Same, and Memory Module Testing Method
Samsung Electronics Co., Ltd.
0 cites