Gangadhar Banappanavar

6 Patents

• US122258082025

  In-line Monitoring of OLED Layer Thickness and Dopant Concentration

  Applied Materials, Inc.

  0 cites
• US121376012024

  In-line Monitoring of OLED Layer Thickness and Dopant Concentration

  Applied Materials, Inc.

  0 cites
• US119275352024

  Metrology for OLED Manufacturing Using Photoluminescence Spectroscopy

  Applied Materials, Inc.

  0 cites
• US118897402024

  In-line Monitoring of OLED Layer Thickness and Dopant Concentration

  Applied Materials, Inc.

  0 cites
• US118568332023

  In-line Monitoring of OLED Layer Thickness and Dopant Concentration

  Applied Materials, Inc.

  0 cites
• US116623172023

  Metrology for OLED Manufacturing Using Photoluminescence Spectroscopy

  Applied Materials, Inc.

  0 cites