Patents/Inventors

Galen L. Pfeiffer

Roca, NEUS2 patents

3 Patents

US124052102025
System For, and Calibration and Testing of Directed Beam Ellipsometer Systems
J.A. WOOLLAM CO., Inc.
0 cites
US123321632025
System For, and Calibration and Testing of Directed Beam Ellipsometer Systems
J.A. WOOLLAM CO., Inc.
0 cites
US118857382024
Reflectometer, Spectrophotometer, Ellipsometer or Polarimeter System Including Sample Imaging System That Simultaneously Meet the Scheimpflug Condition and Overcomes Keystone Error
J.A. WOOLLAM CO., Inc.
0 cites