Patents/Inventors

Fuminori Uematsu

TokyoJP3 patents

4 Patents

US122550412025
Electron Microscope and Method of Correcting Aberration
JEOL Ltd.
0 cites
US118428802023
Estimation Model Generation Method and Electron Microscope
JEOL Ltd.
0 cites
US117889762023
X-ray Measurement Apparatus and X-ray Measurement Method
JEOL Ltd.
0 cites
US117640292023
Method of Measuring Aberration and Electron Microscope
JEOL Ltd.
0 cites