Patents/Inventors

Freddie Erich Babian

Palo Alto, CAUS4 patents

4 Patents

US123076682025
Methods and Systems for Defects Detection and Classification Using X-rays
Bruker Nano, Inc
0 cites
US116880672023
Methods and Systems for Detecting Defects in Devices Using X-rays
Bruker Nano, Inc.
0 cites
US116624792023
Methods and Systems for Printed Circuit Board Design Based on Automatic Corrections
Bruker Nano, Inc.
0 cites
US116514922023
Methods and Systems for Manufacturing Printed Circuit Board Based on X-ray Inspection
Bruker Nano, Inc.
0 cites