Patents/Inventors

Frank Laske

WeilmunsterDE3 patents

4 Patents

US124446282025
Image Modeling-assisted Contour Extraction
KLA CORPORATION
0 cites
US120929662024
Device Feature Specific Edge Placement Error (EPE)
KLA Corporation
0 cites
US120853852024
Design-assisted Large Field of View Metrology
KLA Corporation
0 cites
US116370302023
Multi-stage, Multi-zone Substrate Positioning Systems
KLA Corporation
0 cites