Patents/Inventors

Franciscus Godefridus Casper Bijnen

ValkenswaardNL11 patents

7 Patents

US126186672026
Measurement Apparatus
ASML NETHERLANDS B.V.
0 cites
US122422032025
Target for Measuring a Parameter of a Lithographic Process
ASML Netherlands B.V.
0 cites
US120323052024
Alignment Method and Associated Alignment and Lithographic Apparatuses
ASML NETHERLANDS B.V.
0 cites
US119661662024
Measurement Apparatus and a Method for Determining a Substrate Grid
ASML NETHERLANDS B.V.
0 cites
US119278922024
Alignment Method and Associated Alignment and Lithographic Apparatuses
ASML Netherlands B.V.
0 cites
US118741032024
Measurement Apparatus
ASML NETHERLANDS B.V.
0 cites
US118031302023
Phase Modulators in Alignment to Decrease Mark Size
ASML Holding N.V.
0 cites