8 Patents
- US125481422026Machine Learning Techniques for Wafer Defect Map Classification
Stmicroelectronics International N.V.
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- US120112692024Electrophysiological Signal Processing Method, Corresponding System, Computer Program Product and Vehicle
Stmicroelectronics S.r.l.
0 cites - US119509112024Method of Processing Electrophysiological Signals to Compute a Virtual Vehicle Key, Corresponding Device, Vehicle and Computer Program Product
Stmicroelectronics S.r.l.
0 cites - US119549222024Method of Processing Signals Indicative of a Level of Attention of a Human Individual, Corresponding System, Vehicle and Computer Program Product
Stmicroelectronics S.r.l.
0 cites - 0 cites