Fang-ting Kuo

7 Patents

• US123639872025

  Partial Metal Grain Size Control to Improve CMP Loading Effect

  Taiwan Semiconductor Manufacturing Co., Ltd.

  0 cites
• US122181812025

  Barrier Layer for Metal Insulator Metal Capacitors

  Taiwan Semiconductor Manufacturing Co., Ltd.

  0 cites
• US122118902025

  Barrier Layer for Metal Insulator Metal Capacitors

  Taiwan Semiconductor Manufacturing Co., Ltd.

  0 cites
• US121661042024

  Gate Structure and Methods Thereof

  TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.

  0 cites
• US119787812024

  Partial Metal Grain Size Control to Improve CMP Loading Effect

  Taiwan Semiconductor Manufacturing Co., Ltd.

  0 cites
• US118308892023

  Semiconductor Device and Method of Forming the Same

  TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, Ltd.

  0 cites
• US117990142023

  Gate Structure and Methods Thereof

  TAIWAN SEMICONDUCTOR MANUFACTURING CO., Ltd.

  0 cites