Falgun G. Trivedi

3 Patents

• US118758652024

  Select Gate Reliability

  Micron Technology, Inc.

  0 cites
• US118696072024

  Memory Location Age Tracking on Memory Die

  Micron Technology, Inc.

  0 cites
• US116703762023

  Erasing Partially-programmed Memory Unit

  Micron Technology, Inc.

  0 cites