Fabian Nitsche

2 Patents

• US124110982025

  System and Method for Determining Mass Fractions in a Test Sample with Wave-length Dispersive X-ray Fluorescence Spectrometers

  Bruker AXS SE

  0 cites
• US116788032023

  System and Method for Improved Measurement of Peak Intensities in Pulse Height Spectra Obtained by Wave-length Dispersive X-ray Fluorescence Spectrometers

  Broker AXS GmbH

  0 cites