Patents/Inventors

Evgeny Bal

NatanyaIL2 patents

3 Patents

US124003142025
Mask Inspection for Semiconductor Specimen Fabrication
Applied Materials Israel Ltd.
0 cites
US119838672024
Mask Inspection of a Semiconductor Specimen
Applied Materials Israel Ltd.
0 cites
US117561882023
Determining a Critical Dimension Variation of a Pattern
Applied Materials Israel Ltd.
0 cites