Patents/Inventors

Everhardus Cornelis Mos

BestNL13 patents

8 Patents

US126191592026
Method for Modeling Measurement Data Over a Substrate Area and Associated Apparatuses
ASML Netherlands B.V.
0 cites
US124614512025
Computational Metrology
ASML NETHERLANDS B.V.
0 cites
US122769192025
Method for Controlling a Semiconductor Manufacturing Process
ASML NETHERLANDS B.V.
0 cites
US121893022025
Computational Metrology
ASML NETHERLANDS B.V.
0 cites
US120449812024
Method and Apparatus for Optimization of Lithographic Process
ASML NETHERLANDS B.V.
0 cites
US120455552024
Method to Label Substrates Based on Process Parameters
ASML NETHERLANDS B.V.
0 cites
US119770342024
Methods and Apparatus for Measuring a Property of a Substrate
ASML Netherlands B.V.
0 cites
USRE0494602023
Inspection Method and Apparatus and Lithographic Processing Cell
ASML NETHERLANDS B.V.
0 cites