Patents/Inventors

Eunhye Oh

Suwon-siKR6 patents

7 Patents

US124999612025
Built-in-self-test Logic, Memory Device with Same, and Memory Module Testing Method
Samsung Electronics Co., Ltd.
0 cites
US123341702025
Operating and Testing Semiconductor Devices
Samsung Electronics Co., Ltd.
0 cites
US121643762024
Storage Device Including Mapping Memory and Method of Operating the Same
Samsung Electronics Co., Ltd.
0 cites
US118677572024
Built-in Self-test Circuits and Semiconductor Integrated Circuits Including the Same
Samsung Electronics Co., Ltd.
0 cites
US118042762023
Built-in-self-test Logic, Memory Device with Same, and Memory Module Testing Method
Samsung Electronics Co., Ltd.
0 cites
US116984102023
Semiconductor Integrated Circuit and Method of Testing the Same
Samsung Electronics Co., Ltd.
0 cites
US116988522023
Apparatus and Method for Writing Data in a Memory
SAMSUNG ELECTRONICS CO., Ltd.
0 cites