Patents/Inventors

Eung Joon Lee

SeoulKR1 patent

2 Patents

US124931752025
Flying-over Beam Pattern Scanning Hologram Microscope Device Using Spatial Modulation Scanner and Translation Stage
CUBIXEL CO., Ltd.
0 cites
US124363762025
Flying-over Beam Pattern Scanning Hologram Microscope Device Using Scan Mirror and Translation Stage
CUBIXEL CO., Ltd.
0 cites