Eun Hee Lee

5 Patents

• US124513822025

  Tray and Destructive Analysis Automation Apparatus Including the Same

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US123438812025

  Equipment Front End Module and Destructive Analysis Automation Apparatus Including the Same

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US122061042025

  Positive Electrode Active Material for Lithium Secondary Battery and Method of Preparing the Same

  LG Chem, Ltd.

  0 cites
• US119827052024

  Substrate Analysis Apparatus and Substrate Analysis Method

  SAMSUNG ELECTRONICS CO., Ltd.

  0 cites
• US119732092024

  Positive Electrode Active Material Including Single Particles of Lithium Nickel Composite Transition Metal Oxide, Method of Preparing the Same, and Lithium Secondary Battery Including the Same

  LG Chem, Ltd.

  0 cites