Patents/Inventors

Erik Franken

NuenenNL6 patents

6 Patents

US125671652026
Critical Dimension Measurement in 3D with Geometric Models
FEI Company
0 cites
US123273422025
Automatic Particle Beam Focusing
FEI Company
0 cites
US120740072024
Rotating Sample Holder for Random Angle Sampling in Tomography
FEI Company
0 cites
US119903152024
Measurement and Correction of Optical Aberrations in Charged Particle Beam Microscopy
FEI Company
0 cites
US118878092024
Auto-tuning Stage Settling Time with Feedback in Charged Particle Microscopy
FEI Company
0 cites
US117567622023
Rotating Sample Holder for Random Angle Sampling in Tomography
FEI Company
0 cites